HR TEM Talos F200i
Talos F200i: High-Resolution Analytical Scanning Transmission Electron Microscope (STEM/TEM)The Talos F200i is designed for precise nanoscale material characterization, making it indispensable in nanotechnology and materials science.
This advanced instrument integrates STEM and TEM imaging, delivering high-resolution insights into crystalline and atomic structures.
Operating at 200 kV with a cutting-edge X-CFEG cold electron source, it ensures exceptional beam stability and atomic-level imaging reliability.
Key Features:Energy-Dispersive X-ray Spectroscopy (EDS): Equipped with Dual-XFlash6 detectors, the Talos F200i offers rapid, high-efficiency elemental mapping and chemical composition analysis, crucial for detailed nanoscale research.Five-Axis Piezoelectric Stage: Provides unparalleled stability and precision for consistent, high-quality data acquisition.
NanoEx In-Situ Holder: Enables real-time observation of chemical and electrochemical reactions, expanding research possibilities for dynamic material behavior studies.Ideal for researchers demanding cutting-edge accuracy and detailed material distribution analysis, the Talos F200i stands out as a powerful solution for advanced scientific exploration.
Thermo Fisher Scientific | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Inna Popov
- innap@savion.huji.ac.il